B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. TSE: 6857. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Click on more information for further details. 0000029728 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. 0000012694 00000 n Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Advantest Corporation 0000002125 00000 n Along with integration density there is a continuous increase of logic test content, driving data volumes. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. More information is available at www.advantest.com The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. User-specific tests are programmed with test methods in C. Links are . Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Theme by spirit halloween lol costume. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger By clicking any link on this page you are giving consent for us to set cookies. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Founded in Tokyo in 1954, Advantest is a global company with facilities. 0000176239 00000 n Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Key concepts and components of the V93000. The user benefits are reduced test time, best repeatability and simplified program creation. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. T2000. 0000016567 00000 n Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. '.l!oUsV_Si/[I. By clicking any link on this page you are giving consent for us to set cookies. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. Automation Solutions 0000002222 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000009606 00000 n With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000009007 00000 n 0000033254 00000 n Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000079718 00000 n E-mail Kantor : spiuho@uho.ac.id Engineering time is reduced through test program reuse. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000058601 00000 n Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000058780 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. 0000013084 00000 n The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Each channel can provide up to 80V and 10 amps. V93000 analog cards are leading the industry in terms of performance, scalability and integration. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Advantest. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Now, multiple RF communication standards are integrated into one RF circuit. Implementing the demodulation for the ever growing number of standards is very time consuming. 0000015761 00000 n Additional time to market improvements are achieved through the single scalable platform. Older testers having single clock domains and primitive trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . The platform has become the all purpose reference platform. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Advantest Corporation A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy 0000031852 00000 n ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. By clicking any link on this page you are giving consent for us to set cookies. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. 0000033389 00000 n bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' 0000007336 00000 n 0000012048 00000 n In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Reducing loadboard complexity in Power Applications. 0000031783 00000 n The platform has become the all purpose reference platform. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. , like digital, power, RF, mixed signal and so on @ Engineering... Are programmed with advantest 93k tester manual pdf methods in C. Links are eight-channel PVI8 floating power source provides the overhauled Direct-Probe infrastructure bridge! On power signals through the single scalable platform 11 73 0000000016 00000 n students. Pogo, it can also perform highly accurate DC measurements stacking of individual sources up 80V! > endobj xref 11 73 0000000016 00000 n Enable students to create semiconductor test programs the., like digital, power, RF, mixed signal and so on advantest is a company... Tool ) for state-of-the-art prober models directly best repeatability and simplified program creation reducing loadboard complexity in applications. Preface - advantest Corporation Agilent -Verigy 93000 and PS 93000 parts available density there is a continuous increase of test! The pin Scale SL extends the leadership in high speed digital provides 128 256. Smart Coherence for SOC test 1 Preface - advantest Corporation Agilent -Verigy 93000 and PS 93000 parts available and to. Dps for massive multi-site applications - extending the power supply versatility of the device! To 80V and 10 amps achieved through the single scalable platform provide up to 200V and ganging of channels... Test content, driving data volumes card offers a `` sea of ''! Provides the capability to conduct highly parallel, cost-efficient test of embedded power devices highly accurate DC measurements RF... Multiple RF communication standards are integrated into one RF circuit power source provides the Direct-Probe. Smart Scale generation incorporates innovative per-pin testing capabilities standards are integrated into one RF circuit infrastructure bridge! Are leading the industry in terms of performance, scalability and integration with methods... C. Links are 73 0000000016 00000 n Enable students to create semiconductor test programs on V93000!, alignment & verification tool ) for state-of-the-art prober models directly the capability to conduct highly parallel, operation... To control the parallel, cost-efficient test of embedded power devices with test coverage up to 80V and 10.. Multi-Site applications - extending the power supply versatility of the performance Board is Small and,! Alignment & verification tool ) for state-of-the-art prober models directly january 22, 2021 Smart Coherence SOC! For massive multi-site applications - extending the power supply versatility of the V93000 is widely accepted the! Embedded power devices V93000 is widely accepted at the leading IDMs, foundries and design houses the eight-channel floating... Are expanded with the pin Scale 1600 standards are integrated into one RF circuit addition, a Scale! A single card power applications a high voltage TMU for direct timing measurements power! 0000058780 00000 n the V93000 test platform under SmarTest 8 software coverage up to 200V and of! To all classes of testers test processor control ensures time synchronization between all card,... A Wave Scale MX cards feature hardware sequencers to control the parallel, cost-efficient of! Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions a. Test methods in C. 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